Multi-mode microscopy using diffractive optical elements

Authors

  • Yan Feng
  • Louisa Scholz
  • David Lee
  • Heather Dalgarno
  • David Foo
  • Lei Yang
  • Weiping Lu
  • Alan Greenaway

Abstract

This paper discusses a range of phase-diversity and tracking applications that have been demonstrated experimentally, and will present an analysis of experimental errors associated with the system used. Simultaneous imaging in multiple imaging modes is demonstrated and the use of wavefront-sensing techniques to achieve nanometric depth resolution is reviewed.

Author Biographies

  • Yan Feng
    Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom
  • Louisa Scholz
    Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom
  • David Lee
    UK Astronomy Technology Centre, Edinburgh, United Kingdom
  • Heather Dalgarno
    Dept of Physics and Astronomy, St Andrews University, North Haugh, Fife, United Kingdom
  • David Foo
    Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom
  • Lei Yang
    Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom
  • Weiping Lu
    Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom
  • Alan Greenaway
    Physics, SUPA/IIS, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, United Kingdom

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Published

2011-12-15

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Section

Articles

How to Cite

Multi-mode microscopy using diffractive optical elements. (2011). Engineering Review, 31(2). https://engineeringreview.org/index.php/ER/article/view/34